Skip to content

H-Pin®

Stamped Contact

The H-Pin is a stamped spring probe with the mechanical, electrical, and thermal performance of a spring probe, and the ease of use and high volume manufacturability of a stamped contact. The H-Pin serves applications without the typical compromises that are generally required when considering cost versus performance.

Download Brochure

Features & Benefits

  • Compliancy for large package warpage
  • Stable contact resistance and force
  • Solid beam electrical performance
  • Compliancy at high temperatures (180 °C)
  • Correlated bi, system evaluation and test
  • Reliable power and ground contact
  • Stocked inventory and better lead time
  • High volume capacity, quality control, and ease of use

Feature Options

  • 0.40 mm to 0.70 mm travel
  • Flat-spring rate
  • BeCu H-Pin
  • Stainless steel core spring
  • Bandwidth –1dB @ 15 GHz
  • Current carrying capacity
  • High-volume stamping
  • Reel-to-reel pin insertion

Overview

Excellent mechanical and electrical performance.
Utilizing high volume BeCu stamping technology, combined with a stainless steel spring for mechanical travel, the H-Pin has a working range up to 0.70 mm with a flat spring rate and can be utilized up to 15 GHz with –1.0 dB loss, carry up to 4 A of current and withstand temperatures up to 200 °C.

High volume stamping and quality control.
From pin one to one million, you’ll get the same pin every time. Because of our automated H-Pin manufacturing process, you’ll be the first person to make contact with your pins.

Documents & Literature

Related Products

  • Image of M-Series H-Pin® Socket

    M-Series H-Pin® Socket

    The small outline footprint provides design flexibility and allows for high socket density on the burn-in board.

Related News

  • Image of Raising the Bar of Burn-In Testing Sockets

    Raising the Bar of Burn-In Testing Sockets

    Burn-in testingĀ is widely used as an aid in producing failure-free electronic components. When scientifically planned and conducted, burn-in-testing sockets offer one of the most effective methods of reliability screening at the component level. Testing during production plays a vital role in ensuring reliability and repeatability. Semiconductor manufacturing plants perform tests at each stage of production to eliminate defective parts as early as possible while precisely controlling each process parameter of the chip.

  • Image of Representative Test Socket: DaVinci High Speed Test Socket

    Is it really that hard to improve chip test performance?

    In the digital era, semiconductor chips are present in almost every aspect of our lives. Whether it is from microwave ovens to computers, cell phones, computer central processing units, and other electronic devices there are a variety of chips installed.